Please use this identifier to cite or link to this item: https://saber.ucv.ve/jspui/handle/10872/4005
Full metadata record
DC FieldValueLanguage
dc.contributor.authorMao, X.L.-
dc.contributor.authorFernández, Alberto-
dc.contributor.authorRusso, R.E.-
dc.date.accessioned2013-07-25T17:20:26Z-
dc.date.available2013-07-25T17:20:26Z-
dc.date.issued1994-
dc.identifier.issn0-8194-1776-
dc.identifier.urihttp://hdl.handle.net/10872/4005-
dc.description.abstractBreakdown in Si02 is studied versus fluence using an intensified CCD spectrometer. Broad-band photoluminescence spectra were measured versus number of laser pulses. Before the breakdown of fused silica, the intensity of this photoluminescence increases. After breakdown, a plasma is formed and ablated Si emission lines are measured. The plasma is characterized by its emission spectra and excitation temperature temporal profiles. The temperature profiles of the plasma are calculated by the Bolzmann method. These data are studied to provide fundamental information on breakdown mechanisms in optical materials.es_VE
dc.language.isoen_USes_VE
dc.publisherSPIEes_VE
dc.relation.ispartofseriesVol. 2428;-
dc.subjectLaser ablationes_VE
dc.subjectoptical materialses_VE
dc.subjectfused silicaes_VE
dc.subjectdamage thresholdes_VE
dc.subjectexcitation temperaturees_VE
dc.subjectphotoluminescencees_VE
dc.subjectemission spectraes_VE
dc.titleBehavior of laser induced emission intensity versus laser power density during breakdown of optical materialses_VE
dc.typeArticlees_VE
Appears in Collections:Artículos Publicados

Files in This Item:
File Description SizeFormat 
SPIE 2428.pdf434.43 kBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.