1) Investigación >
Artículos Pre-prints >

Por favor, use este identificador para citar o enlazar este ítem:

Título : Human infection patterns and heterogeneous exposure in River Blindness
Autor : Filipe, João A. N.
Michel, Boussinesq
Renz, Alfons
Collins, Richard C.
Vivas-Martinez, Sarai
Grillet, María-Eugenia
Little, Mark P.
Basáñez, María-Gloria
Palabras clave : onchocerciasis
mathematical model
Fecha de publicación : 15-Oct-2014
Resumen : Patterns of human infection with Onchocerca volvulus (the cause of river blindness) in different continents and ecologies are analyzed. By contrast with some geo-helminths and schistosome parasites, whose worm burdens typically exhibit a humped pattern with host age, patterns of O. volvulus infection vary markedly with locality. To test the hypothesis that such differences are partly due to heterogeneity in exposure to vector bites, we develop an age- and sex-structured model for intensity of infection, with parasite regulation within humans and vectors. The model is fitted to microfilarial data from savannah villages of northern Cameroon, coffee fincas of central Guatemala, and forest-dwelling communities of southern Venezuela, recorded before introducing ivermectin treatment. Estimates of transmission and infection loads are compared with entomological and epidemiological field data. Host age- and sex-heterogeneous exposure largely explains locale-specific infection patterns in onchocerciasis (whereas acquired protective immunity has been invoked for other helminth infections). The basic reproductive number,, ranges from 5 to 8, slightly above estimates for other helminth parasites, but well below previously presented values.
Aparece en las colecciones: Artículos Pre-prints

Ficheros en este ítem:

Fichero Descripción Tamaño Formato
Filipe et al[1]. PNAS 31 Mar 2005.pdf382.19 kBAdobe PDFVisualizar/Abrir

Los ítems de DSpace están protegidos por copyright, con todos los derechos reservados, a menos que se indique lo contrario.


Valid XHTML 1.0! DSpace Software Copyright © 2002-2008 MIT and Hewlett-Packard - Comentarios